Classroom Training for PC-DMIS CMM Level 2  - touch trigger and tactile scanning
This 5 day instructor-led classroom course, held at a Hexagon Manufacturing Intelligence Solution Center, introduces iterative and best fit alignments, auto and quick alignments, more advance dimensioning and extended auto features. Automating probe calibrations and using patterns and loops are included. Scanning concepts for both Touch Trigger Probe (TTP) and Analog Probe users are also taught. Topics include scanning with and without models, using Measurement Strategies and data filtering.
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